PIXE x rays: From Z=4 to Z=92.

A high-intensity, charged-particle-induced x-ray (PIXE) source has been developed for the purpose of characterizing x-ray detectors and optics, and measuring filter transmissions. With energetic proton beams up to 165 keV, intense line x radiations (0.5 Å≤λ≤111 Å) have been generated from the K, L, M, and N shells of elements 4≤Z≤92. The PIXE spectrum has orders-of-magnitude lower background continuum than a conventional electron beam or radioactive α-fluorescence source [C. K. Li, R. D. Petrasso, K. W. Wenzel et al. (to be published)]. [ABSTRACT FROM AUTHOR]