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GPU-based timing-aware test generation for small delay defects.
- Source :
- 2014 19th IEEE European Test Symposium (ETS); 2014, p1-2, 2p
- Publication Year :
- 2014
Details
- Language :
- English
- ISBNs :
- 9781479934157
- Database :
- Complementary Index
- Journal :
- 2014 19th IEEE European Test Symposium (ETS)
- Publication Type :
- Conference
- Accession number :
- 98436215
- Full Text :
- https://doi.org/10.1109/ETS.2014.6847835