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Study of p-type Porous Silicon.
- Source :
- PIERS Proceedings; Aug2014, p1979-1982, 4p
- Publication Year :
- 2014
-
Abstract
- Porous silicon fabricated by electrochemical etching was studied using Scanning Electron Microscope and Elemental Differential X ray Analyzer. The etched samples were found to emit red luminescence when exposed to ultraviolet light of wavelength 254 nm. Micrographs of the samples obtained by Scanning Electron Microscope showed a porous layer at the surface. Elemental Differential X ray Analysis provided the evidence of oxidation of a porous layer. Red luminescence emitted from the surface may be attributed to confinement of holes in the oxidized layer. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 15599450
- Database :
- Complementary Index
- Journal :
- PIERS Proceedings
- Publication Type :
- Academic Journal
- Accession number :
- 98478714