Hourglass concept for RRAM: A dynamic and statistical device model.

Authors :: Degraeve, R.
Fantini, A.
Raghavan, N.
Goux, L.
Clima, S.
Chen, Y. Y.
Belmonte, A.
Cosemans, S.
Govoreanu, B.
Wouters, D. J.
Roussel, Ph.
Kar, G. S.
Groeseneken, G.
Jurczak, M.
Source :: Proceedings of the 21th International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA); 2014, p245-249, 5p
Publication Year :: 2014

Language :: English
ISBNs :: 9781479939312
Database :: Complementary Index
Journal :: Proceedings of the 21th International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA)
Publication Type :: Conference
Accession number :: 98881381
Full Text :: https://doi.org/10.1109/IPFA.2014.6898205