Electronic state of Er in sputtered AlN:Er films determined by magnetic measurements.

MLA

Narang, V., et al. “Electronic State of Er in Sputtered AlN:Er Films Determined by Magnetic Measurements.” Journal of Applied Physics, vol. 116, no. 21, Dec. 2014, pp. 213911-1-213911–16. EBSCOhost, https://doi.org/10.1063/1.4903553.

APA

Narang, V., Korakakis, D., & Seehra, M. S. (2014). Electronic state of Er in sputtered AlN:Er films determined by magnetic measurements. Journal of Applied Physics, 116(21), 213911-1-213911–213916. https://doi.org/10.1063/1.4903553

Chicago

Narang, V., D. Korakakis, and M. S. Seehra. 2014. “Electronic State of Er in Sputtered AlN:Er Films Determined by Magnetic Measurements.” Journal of Applied Physics 116 (21): 213911-1-213911–16. doi:10.1063/1.4903553.