Evaluation of Genes Encoding for the Transient Outward Current (Ito) Identifies the KCND2 Gene as a Cause of J-Wave Syndrome Associated With Sudden Cardiac Death.

The article presents a study that investigates and determines the genetic mutation frequency of the gene encoding of the transient outward current (Ito) of patients who died of sudden cardiac arrest in Canada. Researchers carried out different types of tests, including mutation analysis, mutagenesis and cloning, of 51 patients who had J-wave syndrome. Moreover, they found that the potassium voltage-gated channel (KCND2) gene is the prime cause of the J-wave syndrome and death of patients.