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Rapid super-resolution line-scanning microscopy through virtually structured detection.

Authors :
Yanan Zhi
Rongwen Lu
Benquan Wang
Qiuxiang Zhang
Xincheng Yao
Source :
Optics Letters; 4/15/2015, Vol. 40 Issue 8, p1683-1686, 4p
Publication Year :
2015

Details

Language :
English
ISSN :
01469592
Volume :
40
Issue :
8
Database :
Supplemental Index
Journal :
Optics Letters
Publication Type :
Academic Journal
Accession number :
103284934
Full Text :
https://doi.org/10.1364/OL.40.001683