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Self-powered data erasing of nanoscale flash memory by triboelectricity.

Authors :
Jin, Ik Kyeong
Park, Jun-Young
Lee, Byung-Hyun
Jeon, Seung-Bae
Tcho, Il-Woong
Park, Sang-Jae
Kim, Weon-Guk
Han, Joon-Kyu
Lee, Seung-Wook
Kim, Seong-Yeon
Bae, Hagyoul
Kim, Daewon
Choi, Yang-Kyu
Source :
Nano Energy; Oct2018, Vol. 52, p63-70, 8p
Publication Year :
2018

Abstract

Abstract Irrecoverable data destruction on a mobile device is important to prevent unintentional data disclosure. In this regard, transient electronics, a form of electronics that can be made to disappear or can be destroyed in a controllable manner, has been actively researched. To erase data completely, irreversible reactions such as physical or chemical destruction have been used. However, these techniques either require external voltage or destroy a memory device so that it cannot be reused. Here, we demonstrate a novel self-powered data-erasing method for nanoscale flash memory devices which uses triboelectricity via a kill switch, which consists of a nylon pad connected to a gate electrode of the flash memory. Through a one-time touch of the kill switch by a finger wearing a polytetrafluoroethylene (PTFE) glove, data stored in flash memory is set to the ‘1′ state on the chip scale simultaneously with low-level triboelectricity, allowing the memory to be reused afterward. Moreover, the memory can be permanently destroyed by a single touch of the kill switch with a finger without a glove that generates high-level triboelectricity. These erase methods provide a rapid and convenient means of self-powered irrecoverable data erasing in the era of the Internet of Things (IoT). Graphical abstract fx1 Highlights • First demonstration of data erasing for a silicon-based flash memory without external voltage using triboelectricity. • A memory state of the nanoscale flash memory is changed from a program state to the erase state when triboelectricity is induced to a gate electrode. • This triboelectric data erasing without external power supply is 10<superscript>6</superscript>-fold faster than a conventional erasing method with external power supply. • First demonstration of two-level data-erasing that offers both reusable erasing and permanent destruction against threatening of hacking. • This triboelectric data erasing is applicable to commercial silicon-based flash memory, which has been used for solid-state drive (SSD) and USB memory. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
22112855
Volume :
52
Database :
Supplemental Index
Journal :
Nano Energy
Publication Type :
Academic Journal
Accession number :
131768800
Full Text :
https://doi.org/10.1016/j.nanoen.2018.07.040