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Perturbation Electrochemiluminescence Imaging to Observe the Fluctuation of Charge-Transfer Resistance in Individual Graphene Microsheets with Redox-Induced Defects.

Authors :
Zhu, Hui
Jin, Rong
Jiang, Dechen
Zhu, Jun-Jie
Source :
ACS Applied Materials & Interfaces; 12/18/2019, Vol. 11 Issue 50, p46666-46670, 5p
Publication Year :
2019

Details

Language :
English
ISSN :
19448244
Volume :
11
Issue :
50
Database :
Supplemental Index
Journal :
ACS Applied Materials & Interfaces
Publication Type :
Academic Journal
Accession number :
144854111
Full Text :
https://doi.org/10.1021/acsami.9b14017