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Edge Contact for Carrier Injection and Transport in MoS2 Field-Effect Transistors.

Authors :
Homin Choi
Byoung Hee Moon
Jung Ho Kim
Seok Joon Yun
Gang Hee Han
Sung-gyu Lee
Gul, Hamza Zad
Young Hee Lee
Source :
ACS Nano; 11/26/2019, Vol. 13 Issue 11, p13169-13175, 7p
Publication Year :
2019

Details

Language :
English
ISSN :
19360851
Volume :
13
Issue :
11
Database :
Supplemental Index
Journal :
ACS Nano
Publication Type :
Academic Journal
Accession number :
145007097
Full Text :
https://doi.org/10.1021/acsnano.9b05965