Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN2.

Details

Language :

English

ISSN :

19327447

Volume :

125

Issue :

51

Database :

Supplemental Index

Journal :

Journal of Physical Chemistry C

Publication Type :

Academic Journal

Accession number :

155938049

Full Text :

https://doi.org/10.1021/acs.jpcc.1c08115