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Electric-Field-Induced Metal Filament Formation in Cobalt-Based CBRAM Observed by TEM.
- Source :
- ACS Applied Electronic Materials; 3/28/2023, Vol. 5 Issue 3, p1834-1843, 10p
- Publication Year :
- 2023
Details
- Language :
- English
- ISSN :
- 26376113
- Volume :
- 5
- Issue :
- 3
- Database :
- Supplemental Index
- Journal :
- ACS Applied Electronic Materials
- Publication Type :
- Academic Journal
- Accession number :
- 162752541
- Full Text :
- https://doi.org/10.1021/acsaelm.3c00034