Electric-Field-Induced Metal Filament Formation in Cobalt-Based CBRAM Observed by TEM.

Details

Language :

English

ISSN :

26376113

Volume :

5

Issue :

3

Database :

Supplemental Index

Journal :

ACS Applied Electronic Materials

Publication Type :

Academic Journal

Accession number :

162752541

Full Text :

https://doi.org/10.1021/acsaelm.3c00034