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Origin of the Critical Thickness in Improper Ferroelectric Thin Films.
- Source :
- ACS Applied Materials & Interfaces; 4/12/2023, Vol. 15 Issue 14, p18482-18492, 11p
- Publication Year :
- 2023
Details
- Language :
- English
- ISSN :
- 19448244
- Volume :
- 15
- Issue :
- 14
- Database :
- Supplemental Index
- Journal :
- ACS Applied Materials & Interfaces
- Publication Type :
- Academic Journal
- Accession number :
- 163135199
- Full Text :
- https://doi.org/10.1021/acsami.3c00412