Enhancing Short-Wave Infrared Photosensitivity of SiGe Nanocrystals-Based Films through Embedding Matrix-Induced Passivation, Stress, and Nanocrystallization.

Details

Language :

English

ISSN :

19327447

Volume :

128

Issue :

10

Database :

Supplemental Index

Journal :

Journal of Physical Chemistry C

Publication Type :

Academic Journal

Accession number :

176127289

Full Text :

https://doi.org/10.1021/acs.jpcc.3c06996