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Revealing the Loss Mechanism of Chemically-Induced Hot Electron Transport.

Authors :
Roh, Yujin
Jin, Yeonghoon
Jeon, Beomjoon
Park, Yujin
Yu, Kyoungsik
Park, Jeong Young
Source :
Nano Letters; 3/20/2024, Vol. 24 Issue 11, p3490-3497, 8p
Publication Year :
2024

Details

Language :
English
ISSN :
15306984
Volume :
24
Issue :
11
Database :
Supplemental Index
Journal :
Nano Letters
Publication Type :
Academic Journal
Accession number :
176181726
Full Text :
https://doi.org/10.1021/acs.nanolett.4c00330