Trade-Off between Sample Size and Accuracy: Case of Static Measurements under Interval Uncertainty.

MLA

Siciliano, Bruno, et al. “Trade-Off between Sample Size and Accuracy: Case of Static Measurements under Interval Uncertainty.” Interval / Probabilistic Uncertainty & Non-Classical Logics, 2008, pp. 32–44. EBSCOhost, https://doi.org/10.1007/978-3-540-77664-2_4.

APA

Siciliano, B., Khatib, O., Groen, F., Huynh, V.-N., Nakamori, Y., Ono, H., Lawry, J., Kreinovich, V., Nguyen, H. T., & Kreinovich, V. (2008). Trade-Off between Sample Size and Accuracy: Case of Static Measurements under Interval Uncertainty. In Interval / Probabilistic Uncertainty & Non-Classical Logics (pp. 32–44). https://doi.org/10.1007/978-3-540-77664-2_4

Chicago

Siciliano, Bruno, Oussama Khatib, Frans Groen, Van-Nam Huynh, Yoshiteru Nakamori, Hiroakira Ono, Jonathan Lawry, Vkladik Kreinovich, Hung T. Nguyen, and Vladik Kreinovich. 2008. “Trade-Off between Sample Size and Accuracy: Case of Static Measurements under Interval Uncertainty.” In Interval / Probabilistic Uncertainty & Non-Classical Logics, 32–44. doi:10.1007/978-3-540-77664-2_4.