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Comparison of two techniques for reliable characterization of thin metal-dielectric films.
- Source :
- Applied Optics (1559-128X); 11/20/2011, Vol. 50 Issue 33, p6189-6197, 9p
- Publication Year :
- 2011
Details
- Language :
- English
- ISSN :
- 1559128X
- Volume :
- 50
- Issue :
- 33
- Database :
- Supplemental Index
- Journal :
- Applied Optics (1559-128X)
- Publication Type :
- Academic Journal
- Accession number :
- 70586399
- Full Text :
- https://doi.org/10.1364/ao.50.006189