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Structural and Electrical Characterization of Processable Bis-Silylated Thiophene Oligomers

Authors :
Barbarella, G.
Ostoja, P.
Maccagnani, P.
Pudova, O.
Antolini, L.
Casarini, D.
Bongini, A.
Source :
Chemistry of Materials; November 16, 1998, Vol. 10 Issue: 11 p3683-3689, 7p
Publication Year :
1998

Abstract

A new class of processable, chemically stable, and easily synthesized and purified α,ω-bis(dimethyl-tert-butylsilyl) oligothiophenes is described. Information on the solid-state properties was obtained by single crystal X-ray diffraction and CPMAS NMR spectroscopy. Molecular packing was characterized by a sandwich-type organization, with the molecular planes between adjacent layers along the stacking direction being exactly parallel. Vacuum-evaporated thin films of the tetramer, pentamer, and hexamer displayed field effect transistor activity, with charge mobilities increasing with the substrate deposition temperatures in the range 28−80 °C. The best FET performance was achieved with the pentamer which was characterized by an on/off ratio > 10<SUP>3</SUP>, reproducibility, and a device stability in air of months.

Details

Language :
English
ISSN :
08974756
Volume :
10
Issue :
11
Database :
Supplemental Index
Journal :
Chemistry of Materials
Publication Type :
Periodical
Accession number :
ejs1064132