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Energy Loss of O1s Photoelectrons in Compositional and Structural Transition Layer at and near the SiO2/Si Interface

Authors :
Nohira, H.
Takahashi, Kunimasa
Hattori, Takeshi
Source :
Diffusion and Defect Data Part B: Solid State Phenomena; November 1998, Vol. 65 Issue: 1 p241-244, 4p
Publication Year :
1998

Abstract

Not Available

Details

Language :
English
ISSN :
10120394
Volume :
65
Issue :
1
Database :
Supplemental Index
Journal :
Diffusion and Defect Data Part B: Solid State Phenomena
Publication Type :
Periodical
Accession number :
ejs20120763
Full Text :
https://doi.org/10.4028/www.scientific.net/SSP.65-66.241