Cite
Correction to Aging Dynamics of Solution-Processed Amorphous Oxide Semiconductor Field Effect Transistors
MLA
Bae, Changdeuck, et al. “Correction to Aging Dynamics of Solution-Processed Amorphous Oxide Semiconductor Field Effect Transistors.” ACS Applied Materials & Interfaces, vol. 2, no. 4, Apr. 2010, p. 1273. EBSCOhost, https://doi.org/10.1021/am100216q.
APA
Bae, C., Kim, D., Moon, S., Choi, T., Kim, Y., Kim, B. S., Lee, J.-S., Shin, H., & Moon, J. (2010). Correction to Aging Dynamics of Solution-Processed Amorphous Oxide Semiconductor Field Effect Transistors. ACS Applied Materials & Interfaces, 2(4), 1273. https://doi.org/10.1021/am100216q
Chicago
Bae, Changdeuck, Dongjo Kim, Sunmi Moon, Taeyoung Choi, Youngmin Kim, Bo Sung Kim, Jang-Sik Lee, Hyunjung Shin, and Jooho Moon. 2010. “Correction to Aging Dynamics of Solution-Processed Amorphous Oxide Semiconductor Field Effect Transistors.” ACS Applied Materials & Interfaces 2 (4): 1273. doi:10.1021/am100216q.