Compton imaging with a planar semiconductor system using pulse shape analysis

Homeland security agencies have a requirement to locate and identify nuclear material. Compton cameras [1, 2] offer a more efficient method of gamma-ray detection than collimated detector systems. The resolution of the interaction positions within the detectors greatly influences the accuracy of a reconstructed Compton image. Utilizing digital electronics and applying pulse shape analysis [3] allows the spatial resolution to be enhanced beyond the pixel granularity in three dimensions. Analytically reconstructed Compton images from a range of radiation sources shall be presented with and without pulse shape analysis showing the improvements gained along with a discussion of our analysis methods.