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Electro-thermal simulation of microsystems with mixed abstraction modelling
- Source :
- Microelectronics Reliability; 2001, Vol. 41 Issue: 6 p823-835, 13p
- Publication Year :
- 2001
Details
- Language :
- English
- ISSN :
- 00262714
- Volume :
- 41
- Issue :
- 6
- Database :
- Supplemental Index
- Journal :
- Microelectronics Reliability
- Publication Type :
- Periodical
- Accession number :
- ejs2663087
- Full Text :
- https://doi.org/10.1016/S0026-2714(01)00024-5