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The Ge Stranski-Krastanov growth mode on Si(001)-(2 x 1) tested by X-ray photoelectron and Auger electron diffraction

Authors :
Diani, M.
Aubel, D.
Bischoff, J. L.
Kubler, L.
Source :
Surface Science; 1993, Vol. 291 Issue: 1 p110-110, 1p
Publication Year :
1993

Details

Language :
English
ISSN :
00396028
Volume :
291
Issue :
1
Database :
Supplemental Index
Journal :
Surface Science
Publication Type :
Periodical
Accession number :
ejs2719304
Full Text :
https://doi.org/10.1016/0039-6028(93)91482-5