Back to Search
Start Over
Strong element dependence of C 1s and Si 2p X-ray photoelectron diffraction profiles for identical C and Si local geometries in -SiC
- Source :
- Surface Science; 1995, Vol. 339 Issue: 3 p363-363, 1p
- Publication Year :
- 1995
Details
- Language :
- English
- ISSN :
- 00396028
- Volume :
- 339
- Issue :
- 3
- Database :
- Supplemental Index
- Journal :
- Surface Science
- Publication Type :
- Periodical
- Accession number :
- ejs2722247
- Full Text :
- https://doi.org/10.1016/0039-6028(95)00676-1