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Microspectroscopy and spectromicroscopy with photoemission electron microscopy using a new kind of imaging energy filter

Authors :
Merkel, M.
Escher, M.
Settemeyer, J.
Funnemann, D.
Oelsner, A.
Ziethen, C.
Schmidt, O.
Klais, M.
Schonhense, G.
Source :
Surface Science; 2001, Vol. 480 Issue: 3 p196-202, 7p
Publication Year :
2001

Details

Language :
English
ISSN :
00396028
Volume :
480
Issue :
3
Database :
Supplemental Index
Journal :
Surface Science
Publication Type :
Periodical
Accession number :
ejs2728348
Full Text :
https://doi.org/10.1016/S0039-6028(01)00835-4