The Characterization of CdS Thin Film Prepared by CBD Method

CdS thin film was deposited onto glass substrates by the chemical bath deposition. The deposition temperature was maintained at 75 ºC. The crystal structure, surface morphology, optical and electrical properties have investigated employing X-ray diffraction (XRD), scanning electron microscopy (SEM), spectrophotometer and seeback coefficient measurement, respectively. The XRD reveals CdS thin film grown at 75 ºC has the mixed hexagonal and cubic structure. The optical band gap energy is 2.4 eV. The seeback coefficient is 197.3μV/k at room temperature. The electric resistivity of CdS thin film is in the order of 10000Ω•cm.