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Direct Atomic-Scale Imaging of Hydrogen and Oxygen Interstitials in Pure Niobium Using Atom-Probe Tomography and Aberration-Corrected Scanning Transmission Electron Microscopy

Authors :
Kim, Yoon-Jun
Tao, Runzhe
Klie, Robert F.
Seidman, David N.
Source :
ACS Nano; January 2013, Vol. 7 Issue: 1 p732-739, 8p
Publication Year :
2013

Abstract

Imaging the three-dimensional atomic-scale structure of complex interfaces has been the goal of many recent studies, due to its importance to technologically relevant areas. Combining atom-probe tomography and aberration-corrected scanning transmission electron microscopy (STEM), we present an atomic-scale study of ultrathin (∼5 nm) native oxide layers on niobium (Nb) and the formation of ordered niobium hydride phases near the oxide/Nb interface. Nb, an elemental type-II superconductor with the highest critical temperature (Tc= 9.2 K), is the preferred material for superconducting radio frequency (SRF) cavities in next-generation particle accelerators. Nb exhibits high solubilities for oxygen and hydrogen, especially within the RF-field penetration depth, which is believed to result in SRF quality factor losses. STEM imaging and electron energy-loss spectroscopy followed by ultraviolet laser-assisted local-electrode atom-probe tomography on the same needle-like sample reveals the NbO2, Nb2O5, NbO, Nb stacking sequence; annular bright-field imaging is used to visualize directly hydrogen atoms in bulk β-NbH.

Details

Language :
English
ISSN :
19360851 and 1936086X
Volume :
7
Issue :
1
Database :
Supplemental Index
Journal :
ACS Nano
Publication Type :
Periodical
Accession number :
ejs29216575
Full Text :
https://doi.org/10.1021/nn305029b