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Tests of positive ion beams from a microwave ion source for AMS

Authors :
Schneider, R. J.
Reden, K. F. von
Hayes, J. M.
Wills, J. S.
Kern, W. G.
Kim, S. W.
Source :
Nuclear Instruments and Methods in Physics Research Section B; 2000, Vol. 172 Issue: 1 p252-256, 5p
Publication Year :
2000

Details

Language :
English
ISSN :
0168583X
Volume :
172
Issue :
1
Database :
Supplemental Index
Journal :
Nuclear Instruments and Methods in Physics Research Section B
Publication Type :
Periodical
Accession number :
ejs2950038
Full Text :
https://doi.org/10.1016/S0168-583X(00)00131-2