Test of a compact Si-strip detector for the forward region in DELPHI

The DELPHI detector will be upgraded by a new silicon detector in the very forward region to fulfil the physics demands of the LEP200 program. This detector will cover the angular region between 10° and 25° with respect to the beam pipe and will have a two dimensional readout. The severe space restrictions in this region lead us to develop a new arrangement of detectors and electronic hybrids. In beam tests the layout of the detectors was optimised. Special attention was given to the charge loss in intermediate strips for detectors with large strip pitch. Beam test results obtained with different detector layouts, e.g. various implant widths, and different angle of the incident particles will be shown.