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Growth and characterization of Ge nanocrystals in ultrathin SiO~2 films
- Source :
- Applied Surface Science; 1998, Vol. 130 Issue: 1 p776-780, 5p
- Publication Year :
- 1998
Details
- Language :
- English
- ISSN :
- 01694332
- Volume :
- 130
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Applied Surface Science
- Publication Type :
- Periodical
- Accession number :
- ejs2989369
- Full Text :
- https://doi.org/10.1016/S0169-4332(98)00153-6