Back to Search Start Over

Local binary pattern statistics feature for reduced reference image quality assessment

Authors :
Sampat, Nitin
Battiato, Sebastiano
Zhang, Min
Mou, Xuanqin
Fujita, Hiroshi
Zhang, Lei
Zhou, Xiangrong
Xue, Wufeng
Source :
Proceedings of SPIE; January 2013, Vol. 8660 Issue: 1 p86600L-86600L-8, 779409p
Publication Year :
2013

Details

Language :
English
ISSN :
0277786X
Volume :
8660
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs31088685
Full Text :
https://doi.org/10.1117/12.2008646