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The importance of lithography and advanced etch techniques for nanofabrication of MOS capacitor with HfO2

Authors :
Zhang, Ying
Oehrlein, Gottlieb S.
Lin, Qinghuang
Belete, Melkamu A.
Source :
Proceedings of SPIE; March 2013, Vol. 8685 Issue: 1 p86850W-86850W-4, 781655p
Publication Year :
2013

Details

Language :
English
ISSN :
0277786X
Volume :
8685
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs31091910
Full Text :
https://doi.org/10.1117/12.2020003