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Silicon optics for wide field x-ray imaging

Authors :
O'Dell, Stephen L.
Pareschi, Giovanni
Willingale, R.
Ackermann, M.
Collon, M.
Source :
Proceedings of SPIE; September 2013, Vol. 8861 Issue: 1 p88611O-88611O-9, 797509p
Publication Year :
2013

Details

Language :
English
ISSN :
0277786X
Volume :
8861
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs31282971
Full Text :
https://doi.org/10.1117/12.2026536