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Aspherically bent SiC mirror: bending test

Authors :
Ishiguro, E.
Sugawara, H.
Okuyama, M.
Waku, N.
Sato, S.
Takigawa, T.
Source :
Journal of Electron Spectroscopy and Related Phenomena; 1996, Vol. 80 Issue: 1 p489-492, 4p
Publication Year :
1996

Details

Language :
English
ISSN :
03682048
Volume :
80
Issue :
1
Database :
Supplemental Index
Journal :
Journal of Electron Spectroscopy and Related Phenomena
Publication Type :
Periodical
Accession number :
ejs3177262
Full Text :
https://doi.org/10.1016/0368-2048(96)03023-X