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Geometrical superresolution in infrared sensor: experimental verification

Authors :
Zalevsky, Zeev
Shamir, Noam
Mendlovic, David
Source :
Optical Engineering; June 2004, Vol. 43 Issue: 6 p1401-1406, 6p
Publication Year :
2004

Abstract

The resolution of many imaging systems is often restricted by the limited spatial resolution of its sensing device rather than by diffraction limits related to the optical system. This spatial resolution of the sensor, when limited by the pixels’ dimensions, is coined as “geometrical resolution.” Earlier, we suggested a technique for overcoming this limit, thus obtaining “geometrical superresolution.” The proposed approach is based on capturing a set of images after attaching special predesigned mask to the detector plane, interlacing the pixels of the captured images, and eventually applying inverse filtering over the interlaced image. Experimental results are presented to demonstrate the ability of the suggested technique. © 2004 Society of Photo-Optical Instrumentation Engineers.

Details

Language :
English
ISSN :
00913286 and 15602303
Volume :
43
Issue :
6
Database :
Supplemental Index
Journal :
Optical Engineering
Publication Type :
Periodical
Accession number :
ejs33076306
Full Text :
https://doi.org/10.1117/1.1737372