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Technology and device-design enhancements for improved read noise performance in fully depleted CCDs

Authors :
Holland, Andrew D.
Beletic, James
Holland, S. E.
Bebek, C. J.
Dion, F.
Frost, R.
Groulx, R.
Lee, J. S.
Wang, G.
Source :
Proceedings of SPIE; July 2013, Vol. 9154 Issue: 1 p91541E-91541E-11, 9062571p
Publication Year :
2013

Details

Language :
English
ISSN :
0277786X
Volume :
9154
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs33523650
Full Text :
https://doi.org/10.1117/12.2057219