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Relationship between Residual Stresses and Damaging in Thermally Grown Oxide on Metals: Raman Spectroscopy and Synchrotron Micro-Diffraction Contributions
- Source :
- Advances in Science and Technology; October 2006, Vol. 45 Issue: 1 p100-107, 8p
- Publication Year :
- 2006
-
Abstract
- Ni-30Cr and Fe-47Cr alloys have been oxidized at 900 and 1000°C in air. The influence of the oxidation and cooling conditions on the magnitude of residual stresses present in the oxide scale as well as the existing relaxation modes are studied. A rigorous determination of the residual stresses at both macroscopic scale in the oxide film adherent to the substrate and local scale over the damaged areas allows a comparison with models describing thin film delamination. A multi-scale approach is then proposed : Residual stress levels are determined thanks to conventional x-ray diffraction and Raman spectroscopy while mappings are done over different types of buckling using Raman micro-spectroscopy and synchrotron micro-diffraction. Additional morphological information combined to associated stress levels is injected in the mechanical laws for buckling in order to extract the interfacial toughness.
Details
- Language :
- English
- ISSN :
- 16628969
- Volume :
- 45
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Advances in Science and Technology
- Publication Type :
- Periodical
- Accession number :
- ejs34135222
- Full Text :
- https://doi.org/10.4028/www.scientific.net/AST.91.100