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Relationship between Residual Stresses and Damaging in Thermally Grown Oxide on Metals: Raman Spectroscopy and Synchrotron Micro-Diffraction Contributions

Authors :
Grosseau-Poussard, Jean Luc
Guerain, Mathieu
Goudeau, Philippe
Geandier, Guillaume
Panicaud, Benoit
Tamura, Nobumichi
Kunz, Martin
Dejoie, Catherine
Micha, Jean Sebastien
Source :
Advances in Science and Technology; October 2006, Vol. 45 Issue: 1 p100-107, 8p
Publication Year :
2006

Abstract

Ni-30Cr and Fe-47Cr alloys have been oxidized at 900 and 1000°C in air. The influence of the oxidation and cooling conditions on the magnitude of residual stresses present in the oxide scale as well as the existing relaxation modes are studied. A rigorous determination of the residual stresses at both macroscopic scale in the oxide film adherent to the substrate and local scale over the damaged areas allows a comparison with models describing thin film delamination. A multi-scale approach is then proposed : Residual stress levels are determined thanks to conventional x-ray diffraction and Raman spectroscopy while mappings are done over different types of buckling using Raman micro-spectroscopy and synchrotron micro-diffraction. Additional morphological information combined to associated stress levels is injected in the mechanical laws for buckling in order to extract the interfacial toughness.

Details

Language :
English
ISSN :
16628969
Volume :
45
Issue :
1
Database :
Supplemental Index
Journal :
Advances in Science and Technology
Publication Type :
Periodical
Accession number :
ejs34135222
Full Text :
https://doi.org/10.4028/www.scientific.net/AST.91.100