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A new tool for measuring island dimensions and spatial correlations in quantum dot multilayers: Raman scattering interferences
- Source :
- Materials Science and Engineering B: Solid-State Materials for Advanced Technology; 2002, Vol. 88 Issue: 2-3 p173-176, 4p
- Publication Year :
- 2002
Details
- Language :
- English
- ISSN :
- 09215107
- Volume :
- 88
- Issue :
- 2-3
- Database :
- Supplemental Index
- Journal :
- Materials Science and Engineering B: Solid-State Materials for Advanced Technology
- Publication Type :
- Periodical
- Accession number :
- ejs3416997
- Full Text :
- https://doi.org/10.1016/S0921-5107(01)00888-1