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Time-domain reflection field analysis for ultrasonic evaluation of thin layered media

Authors :
Kim, B.-G.
Lee, S.
Kishi, T.
Source :
NDT & E International; 1996, Vol. 29 Issue: 5 p317-322, 6p
Publication Year :
1996

Details

Language :
English
ISSN :
09638695
Volume :
29
Issue :
5
Database :
Supplemental Index
Journal :
NDT & E International
Publication Type :
Periodical
Accession number :
ejs3523782
Full Text :
https://doi.org/10.1016/S0963-8695(96)00035-7