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TEM characterisation of porous silicon
- Source :
- Micron; 2000, Vol. 31 Issue: 3 p223-230, 8p
- Publication Year :
- 2000
Details
- Language :
- English
- ISSN :
- 09684328
- Volume :
- 31
- Issue :
- 3
- Database :
- Supplemental Index
- Journal :
- Micron
- Publication Type :
- Periodical
- Accession number :
- ejs3535353
- Full Text :
- https://doi.org/10.1016/S0968-4328(99)00087-6