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Semiconductor and Thermoluminescent Dosimetry of Pulsed Soft X Ray Plasma Sources
- Source :
- Radiation Protection Dosimetry; July 2002, Vol. 100 Issue: 1-4 p429-429, 1p
- Publication Year :
- 2002
-
Abstract
- A multichannel detection system having a dynamic range of "1 x 10-9 Gy - 20 Gy was developed with the use of commercially produced Si-photodiodes and TLDs for accurate measurement of X ray energy emitted from plasma-focus facility and from laser-produced plasmas. The proof of linearity of the employed detectors accomplished by a comparison of their responses to a broad band spectrum of X rays emitted from plasmas, is reported. It is demonstrated that TLDs irradiated with no protective filter show an incorrect response due to overloading in the sub-keV range and repopulation of dosimetric peaks induced by the UV radiation. The measurement of the power of undesirable secondary X ray sources driven by the primary plasma inside the interaction chamber was performed on the basis of analysis of space dependence of X ray intensity with respect to the assumed r-2 decrease in the intensity far away from the plasma.
Details
- Language :
- English
- ISSN :
- 01448420 and 17423406
- Volume :
- 100
- Issue :
- 1-4
- Database :
- Supplemental Index
- Journal :
- Radiation Protection Dosimetry
- Publication Type :
- Periodical
- Accession number :
- ejs35939346
- Full Text :
- https://doi.org/10.1093/oxfordjournals.rpd.a005906