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Investigations in cobalt doped silicon by DLTS and Mössbauer effect

Authors :
Scheibe, E.
Schröter, W.
Source :
Physica B&C; February 1983, Vol. 116 Issue: 1-3 p318-322, 5p
Publication Year :
1983

Abstract

We have investigated the system Co in Si by Möβbauer spectroscopy and DLTS. In p-type silicon no DLTS signal of cobalt species between Ev+ 0.1 eV and Ev+ 0.5 eV, neither of substitutional cobalt nor of Co-B pairs, is found giving evidence that many assignments in the literature of ionization energies to cobalt in solution are doubtful. If one lowers the diffusion temperature to 940 °C the main part of Co in Si remains in solution as substitutional cobalt and as a new species, tentatively attributed to a pair of cobalt with a shallow boron acceptor (sa). This new species even found in specimens with a boron concentration of Nsa= 2.8 1015cm-3anneals out below 110 °C.

Details

Language :
English
ISSN :
03784363
Volume :
116
Issue :
1-3
Database :
Supplemental Index
Journal :
Physica B&C
Publication Type :
Periodical
Accession number :
ejs36236659
Full Text :
https://doi.org/10.1016/0378-4363(83)90267-X