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X-Ray Diffraction Profile Analysis of Powdered Samples
- Source :
- Powder Diffraction; June 1989, Vol. 4 Issue: 2 p70-73, 4p
- Publication Year :
- 1989
-
Abstract
- AbstractA quantitative phase analysis often requires advanced numerical studies to determine the appropriate intensity values. In this paper the method of fitting analytical functions to the experimental profile is applied to X-ray powder diffraction patterns obtained with FeK radiation. In the present work, the authors examine some problems connected with numerical studies, especially the function describing the experimental profile. The usefulness of the ?2elimination procedure and the angular dependence FWHM are also examined.
Details
- Language :
- English
- ISSN :
- 08857156 and 19457413
- Volume :
- 4
- Issue :
- 2
- Database :
- Supplemental Index
- Journal :
- Powder Diffraction
- Publication Type :
- Periodical
- Accession number :
- ejs40717232
- Full Text :
- https://doi.org/10.1017/S0885715600016444