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X-Ray Diffraction Profile Analysis of Powdered Samples

Authors :
Stanisz, G.J.
Holender, J.M.
So?tys, J.
Source :
Powder Diffraction; June 1989, Vol. 4 Issue: 2 p70-73, 4p
Publication Year :
1989

Abstract

AbstractA quantitative phase analysis often requires advanced numerical studies to determine the appropriate intensity values. In this paper the method of fitting analytical functions to the experimental profile is applied to X-ray powder diffraction patterns obtained with FeK radiation. In the present work, the authors examine some problems connected with numerical studies, especially the function describing the experimental profile. The usefulness of the ?2elimination procedure and the angular dependence FWHM are also examined.

Details

Language :
English
ISSN :
08857156 and 19457413
Volume :
4
Issue :
2
Database :
Supplemental Index
Journal :
Powder Diffraction
Publication Type :
Periodical
Accession number :
ejs40717232
Full Text :
https://doi.org/10.1017/S0885715600016444