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Soft X-ray microscope with nanometer spatial resolution and its applications

Authors :
Romaniuk, Ryszard S.
Kopczynski, Krzysztof
Jabczyński, Jan K.
Mierczyk, Zygmunt
Wachulak, P. W.
Torrisi, A.
Bartnik, A.
Wegrzynski, L.
Fok, T.
Patron, Z.
Fiedorowicz, H.
Source :
Proceedings of SPIE; December 2016, Vol. 10159 Issue: 1 p101590W-101590W-8, 914319p
Publication Year :
2016

Details

Language :
English
ISSN :
0277786X
Volume :
10159
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs40822243
Full Text :
https://doi.org/10.1117/12.2259877