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A first order analytical TOD sensor performance model

Authors :
Huckridge, David A.
Ebert, Reinhard
Lee, Stephen T.
Bijl, Piet
Hogervorst, Maarten A.
Source :
Proceedings of SPIE; October 2016, Vol. 9987 Issue: 1 p99870P-99870P-18, 9887149p
Publication Year :
2016

Details

Language :
English
ISSN :
0277786X
Volume :
9987
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs40955886
Full Text :
https://doi.org/10.1117/12.2242262