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Statistical characterization of an x-ray FEL in the spectral domain

Authors :
Tschentscher, Thomas
Patthey, Luc
Lutman, Alberto
Huang, Zhirong
Krzywinski, Jacek
Wu, Juhao
Zhu, Diling
Feng, Yiping
Source :
Proceedings of SPIE; May 2017, Vol. 10237 Issue: 1 p102370H-102370H-10, 10134641p
Publication Year :
2017

Details

Language :
English
ISSN :
0277786X
Volume :
10237
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs42861088
Full Text :
https://doi.org/10.1117/12.2268918