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Actinic inspection of EUV reticles with arbitrary pattern design

Authors :
Gargini, Paolo A.
Naulleau, Patrick P.
Ronse, Kurt G.
Itani, Toshiro
Mochi, Iacopo
Helfenstein, Patrick
Rajeev, Rajendran
Fernandez, Sara
Kazazis, Dimitrios
Yoshitake, Shusuke
Ekinci, Yasin
Source :
Proceedings of SPIE; October 2017, Vol. 10450 Issue: 1 p1045007-1045007-10
Publication Year :
2017

Details

Language :
English
ISSN :
0277786X
Volume :
10450
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs44219218
Full Text :
https://doi.org/10.1117/12.2280528