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Exploiting side-channel emissions to detect changes in FPGA firmware

Authors :
Ternovskiy, Igor V.
Chin, Peter
Fuller, Ryan M.
Riley, Ronald A.
Graham, James T.
Source :
Proceedings of SPIE; June 2018, Vol. 10630 Issue: 1 p106300A-106300A-11, 10523712p
Publication Year :
2018

Details

Language :
English
ISSN :
0277786X
Volume :
10630
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs45835290
Full Text :
https://doi.org/10.1117/12.2304450