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Ultrashort-Pulse Reflectometry in the Gamma 10 Device

Authors :
Itakura, A.
Hirai, T.
Hojo, H.
Kohagura, J.
Shima, Y.
Tsunoda, S.
Yoshikawa, M.
Yatsu, K.
Source :
Fusion Science and Technology; January 2003, Vol. 43 Issue: 1 p243-247, 5p
Publication Year :
2003

Abstract

An electron density profile is observed by using an ultrashort-pulse reflectometry in the central cell of the GAMMA 10 device. The pulse having 65 ps FWHM is launched into the plasma in the O-mode and reflected at the cut off layer. The frequency range of the receiving system is 6 to 11 GHz. Time of flight of the received signal is measured via a time to amplitude converter and processed by a computer. Here, electron density profile lower than 1.5 × 1018m−3is reconstructed within one-shot data. The time variation of the electron density profile is acquired. Reflected wave has information of fluctuation, simultaneously. Frequency spectrum of the fluctuation is also observed.

Details

Language :
English
ISSN :
15361055
Volume :
43
Issue :
1
Database :
Supplemental Index
Journal :
Fusion Science and Technology
Publication Type :
Periodical
Accession number :
ejs49748562
Full Text :
https://doi.org/10.13182/FST03-A11963603