Accurate Threshold Voltage Reliability Evaluation of Thin Al2O3Top-Gated Dielectric Black Phosphorous FETs Using Ultrafast Measurement Pulses

MLA

Goyal, Natasha, et al. “Accurate Threshold Voltage Reliability Evaluation of Thin Al2O3Top-Gated Dielectric Black Phosphorous FETs Using Ultrafast Measurement Pulses.” ACS Applied Materials & Interfaces, vol. 11, no. 26, July 2019, pp. 23673–80. EBSCOhost, https://doi.org/10.1021/acsami.9b04069.

APA

Goyal, N., Parihar, N., Jawa, H., Mahapatra, S., & Lodha, S. (2019). Accurate Threshold Voltage Reliability Evaluation of Thin Al2O3Top-Gated Dielectric Black Phosphorous FETs Using Ultrafast Measurement Pulses. ACS Applied Materials & Interfaces, 11(26), 23673–23680. https://doi.org/10.1021/acsami.9b04069

Chicago

Goyal, Natasha, Narendra Parihar, Himani Jawa, Souvik Mahapatra, and Saurabh Lodha. 2019. “Accurate Threshold Voltage Reliability Evaluation of Thin Al2O3Top-Gated Dielectric Black Phosphorous FETs Using Ultrafast Measurement Pulses.” ACS Applied Materials & Interfaces 11 (26): 23673–80. doi:10.1021/acsami.9b04069.